In this thesis, we have studied the structural and magnetic properties of CoPd thin films, prepared by pulsed laser deposition method on MgO (001), amorphous SiO 2 and Si (001) with different deposition conditions. Also, the effect of Cobalt content, thickness, annealing in the hydrogen atmosphere, and deposition temperature, has been widely investigated. In this study, for characterizing the structural properties, we used x-ray diffraction (XRD) and reflectivity (XRR), Rutherford backscattering spectroscopy (RBS), energy dispersive X-ray spectroscopy (EDS) and atomic force microscopy (AFM). For the magnetic characterization, we used vibrating sample magnetometer (VSM), ferromagnetic resonance (FMR), and magneto-optical Kerr effect (MOKE). As a part of this project, we set up a home-made magneto-optical Kerr effect system. In this setup, we used LabVIEW programming for controlling the power supply and data acquisition. In-plane anisotropy of Co x Pd 100-x (x=23, 36, 43) thin films on MgO substrate was investigated using magneto-optical Kerr effect microscope. We observed that the in-plane anisotropy changes from fourfold to twofold by the increase of cobalt. Some anomalous magnetization reversal was observed in the nominal hard axes for Co x Pd 100-x (x=23, 36) where intergranular exchange interaction is weak. These behaviors were became eliminated by increase of cobalt content. We explained the observations using the two-grain Stoner-Wohlfarth model. In addition, observed quadratic magneto-optical Kerr effect (QMOKE) used as an auxiliary method to explain domain rotation that was in consistent with the two-grain Stoner-Wohlfarth model. In this case, thickness and annealing didot have a noticeable effect on the fourfold in-plane anisotropy type but changed its value. In the case of samples on amorphous SiO 2 , we observed that the perpendicular anisotropy enhances by the increase of palladium content. In the case of samples on Si (001) substrate, the effect of hydrogen annealing was very impressive. The H 2 annealing enhanced the coercivity value from 13 to 72 Oe, which is attributed to the decreasing of the grain size of the annealed films. In this series of samples, anisotropy moves to the perpendicular direction by lowering the thickness from 24 to 6 nm. Moreover, the perpendicular anisotropy enhanced by the increase of the deposition temperature from 200 to 600 o C.